Dielectric Measurements of Nanocrystalline VO-=SUB=-2-=/SUB=- : Fe Films
نویسندگان
چکیده
Dielectric spectroscopy methods revealed the existence of two types relaxation processes in semiconductor phase VO 2 : Fe films. The characteristic times are denoted by tau 1 and . It is shown that temperature dependences have hysteresis, position loops which coincides with points semiconductor-metal transition. corresponds to undoped, Fe-doped nanocrystallites film. physical mechanism process due establishment equilibrium after action an electric field on conduction electrons. numerical values parameters distribution relaxers over determined. Keywords: dielectric measurements, correlation effects, vanadium dioxide, VO2, insulator-metal transition
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ژورنال
عنوان ژورنال: Optics and Spectroscopy
سال: 2022
ISSN: ['0030-400X', '1562-6911']
DOI: https://doi.org/10.21883/eos.2022.10.54859.3902-22